| Title | Author(s) | Reference |
|---|---|---|
| Films and Stratified Specimens. | J.L. Pouchou & F. Pichoir | Scanning Microscopy Suppl. 7, 167-189, (1993). ONERA, F-92320 Châtilllon, France. |
| X-ray Microanalysis of Startified Specimens. | J.L. Pouchou | Analytica Chimica Acta, 283, 81-97, (1993). ONERA, F-92320 Châtilllon, France. |
| X-ray Microanalysis for Thin Film Layered specimens Containing Light Elements. | D.G. Rickerby | Mikrochimica Acta 114/115, 421-429 (1994). Institute for Advanced Materils, Commission of European Communities, JRC, I-21020 ISPRA(VA), Italy. |
| Electron Probe X-ray Analysis of Stratified Bulk Samples. | J.L. Lábár | Archives of Metallurgy, Volume 40, Issue 1 (1995). Research Institute for Technical Physics, H-1325, Budapest, PÓTI ÚT 56, P.O. Box 76, Hungary. |
| Use of Soft X-rays in Microanalysis. | J.L. Pouchou | Mikrochimica Acta, Suppl. 13, (1996).ONERA, F-92320 Châtilllon, France. |
| Procedures for X-ray Microanalysis of layered structure: Accuracy and limits. | J.L. Pouchou & J.F. Thiot | Microscopy & Microanalysis 1996, Editor Bailey & all, San Francisco Press, pages 486-487. |
| Standardless x-ray analysis of bulk specimens | J.L. Pouchou | Mikrochim Acta 114/115 : 33-52 (1994) |
| Virtual WDS | S.J.B. Reed & A. and Buckley | Mikrochim. Acta (suppl.) 13,479-83 (1996) |
| Standardless quantitative analysis by x-ray spectrometry | J.L. Lábár | Scanning Microscopy (suppl.) 7 :133-151 (1993) |
| Optimizing the electron microprobe analysis of hydrous alkali aluminosilicate glasses, American Mineralogist | G. Morgan & D. London | American Mineralogist, Volume 81, pages 1176-1185. (1996) |
| EPMA quantitative x-ray mapping | J.F. Thiot, & J.L. Pouchou | Microscopy & Microanalysis (1996), Editor Bailey & all, San Francisco Press, pages 335-337. |