Technical References

Title Author(s) Reference
Films and Stratified Specimens. J.L. Pouchou & F. Pichoir Scanning Microscopy Suppl. 7, 167-189, (1993). ONERA, F-92320 Châtilllon, France.
X-ray Microanalysis of Startified Specimens. J.L. Pouchou Analytica Chimica Acta, 283, 81-97, (1993). ONERA, F-92320 Châtilllon, France.
X-ray Microanalysis for Thin Film Layered specimens Containing Light Elements. D.G. Rickerby Mikrochimica Acta 114/115, 421-429 (1994). Institute for Advanced Materils, Commission of European Communities, JRC, I-21020 ISPRA(VA), Italy.
Electron Probe X-ray Analysis of Stratified Bulk Samples. J.L. Lábár Archives of Metallurgy, Volume 40, Issue 1 (1995). Research Institute for Technical Physics, H-1325, Budapest, PÓTI ÚT 56, P.O. Box 76, Hungary.
Use of Soft X-rays in Microanalysis. J.L. Pouchou Mikrochimica Acta, Suppl. 13, (1996).ONERA, F-92320 Châtilllon, France.
Procedures for X-ray Microanalysis of layered structure: Accuracy and limits. J.L. Pouchou & J.F. Thiot Microscopy & Microanalysis 1996, Editor Bailey & all, San Francisco Press, pages 486-487.
Standardless x-ray analysis of bulk specimens J.L. Pouchou Mikrochim Acta 114/115 : 33-52 (1994)
Virtual WDS S.J.B. Reed & A. and Buckley Mikrochim. Acta (suppl.) 13,479-83 (1996)
Standardless quantitative analysis by x-ray spectrometry J.L. Lábár Scanning Microscopy (suppl.) 7 :133-151 (1993)
Optimizing the electron microprobe analysis of hydrous alkali aluminosilicate glasses, American Mineralogist G. Morgan & D. London American Mineralogist, Volume 81, pages 1176-1185. (1996)
EPMA quantitative x-ray mapping J.F. Thiot, & J.L. Pouchou Microscopy & Microanalysis (1996), Editor Bailey & all, San Francisco Press, pages 335-337.